Autonomous Model Lifecycle Management for Digital Twin-Based Manufacturing Control

arXiv:2609.22701 · cs.LG · Submitted 2026-09-19 · Read on arXiv

cs.LG

Submitted: 2026-09-19

Updated: 2026-09-19

Comments: The paper has been accepted for publication in the 2026 IEEE International Conference on Systems, Man, and Cybernetics (SMC 2026). The final published version will be made available on IEEE Xplore

License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/

Terminology

• Digital Twin — 2× in this paper · explained in 5 episodes
• Accuracy — 1× in this paper · explained in 1 episode
• Deep Reinforcement Learning — 1× in this paper · explained in 2 episodes
• Reinforcement Learning — 1× in this paper · explained in 4 episodes
• Reinforcement Learning (RL) — 1× in this paper · explained in 25 episodes

Related papers

• Polynomial-Augmented Neural Networks (PANNs) with Weak Orthogonality Constraints for Enhanced Function and PDE Approximation
• AIRL-S: Unifying Reinforcement Learning and Search-Based Test-Time Scaling via Adversarial Inverse Reinforcement Learning
• Transformers as Bayesian In-Context Experimenters: Smoothness-Adaptive Efficient ATE Estimation
• Convergence issues in Relational Concept Analysis based on AOC-posets
• Beliefs Beyond Posteriors: Local-Consistency Optimisation for Bayesian Neural Networks
• Understanding Diffusion Models via Ratio-Based Function Approximation with SignReLU Networks