Morphology-Aware Ambiguity Learning for Wafer Defect Decision Support

arXiv:2609.21866 · cs.CV · Submitted 2026-09-18 · Read on arXiv

cs.CV

Submitted: 2026-09-18

Updated: 2026-09-18

Terminology

Accuracy — 9× in this paper · explained in 1 episode
Hyperparameters — 6× in this paper · explained in 2 episodes
Regularization — 5× in this paper · explained in 3 episodes
Verification — 5× in this paper · explained in 2 episodes
Data Augmentation — 4× in this paper · explained in 7 episodes
Ablation — 3× in this paper · explained in 1 episode
Benchmark — 3× in this paper · explained in 2 episodes
Clustering — 3× in this paper · explained in 2 episodes
Conformal Prediction — 3× in this paper · explained in 6 episodes
Representation Learning — 3× in this paper · explained in 2 episodes
Robustness — 3× in this paper · explained in 5 episodes
Gaussian Mixture Model (GMM) — 2× in this paper · explained in 2 episodes
Normalizing Flow — 2× in this paper · explained in 3 episodes
Normalizing Flows — 2× in this paper · explained in 4 episodes
Principal Component Analysis (PCA) — 2× in this paper · explained in 4 episodes
Transformer — 2× in this paper · explained in 2 episodes
Ablation study — 1× in this paper · explained in 1 episode
Action Space — 1× in this paper · explained in 1 episode
Alignment — 1× in this paper · explained in 1 episode
Conference on Computer Vision and Pattern Recognition — 1× in this paper
Contrastive Learning — 1× in this paper · explained in 5 episodes
F1 Score — 1× in this paper · explained in 3 episodes
Human-in-the-Loop — 1× in this paper · explained in 3 episodes

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