TASTE: Throughput-Aware Batch Size Tuning for On-Device Edge Learning

arXiv:2609.07444 · cs.LG, cs.AI, cs.AR, cs.PF · Submitted 2026-09-07 · Read on arXiv

cs.LG, cs.AI, cs.AR, cs.PF

Submitted: 2026-09-07

Updated: 2026-09-07

Comments: 8 pages, 1 tables, 6 figures; Accepted to 29th Euromicro DSD 2026

License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/

Terminology

• Accuracy — 2× in this paper · explained in 1 episode
• Adaptation — 1× in this paper · explained in 1 episode
• Artificial Intelligence (AI) — 1× in this paper · explained in 2 episodes
• Bayesian Optimization — 1× in this paper · explained in 3 episodes
• Catastrophic Forgetting — 1× in this paper · explained in 5 episodes
• Continual Learning — 1× in this paper · explained in 2 episodes
• Edge Devices — 1× in this paper · explained in 2 episodes
• Personalization — 1× in this paper · explained in 2 episodes

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