Physical-Layer Fingerprint-Space Capacity Analysis for 100BASE-TX Devices in IIoT

arXiv:2608.27164 · cs.CR, eess.SP · Submitted 2026-08-27 · Read on arXiv

cs.CR, eess.SP

Submitted: 2026-08-27

Updated: 2026-08-27

Comments: 12 pages, 7 figures, 5 tables. Submitted to IEEE Internet of Things Journal

License: http://arxiv.org/licenses/nonexclusive-distrib/1.0/

Terminology

• Fingerprinting — 15× in this paper · explained in 2 episodes
• Quantization — 10× in this paper · explained in 12 episodes
• Accuracy — 5× in this paper · explained in 1 episode
• Industrial Internet of Things — 5× in this paper
• Feature Extraction — 2× in this paper · explained in 2 episodes
• Edge Devices — 1× in this paper · explained in 2 episodes
• Reconstruction Error — 1× in this paper · explained in 2 episodes
• Results of the Nonlinear and ImpulseResponse Model — 1× in this paper
• Robustness — 1× in this paper · explained in 5 episodes
• Singular Value Decomposition (SVD) — 1× in this paper · explained in 2 episodes
• Trace — 1× in this paper · explained in 2 episodes
• Transformer — 1× in this paper · explained in 2 episodes

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