Microscopic Modeling of Surface Roughness Scattering in Inversion Layers of MOSFETs Based on Ando's Linear Model

arXiv:2604.22155 · cond-mat.mes-hall · Submitted 2026-04-24 · Read on arXiv

cond-mat.mes-hall

Submitted: 2026-04-24

Updated: 2026-09-24

Terminology

Related papers